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Equipment
Equipment
Category
Room
Filmetrics F20
Metrology
1417
HP 4155 Parametric Analyzer/Probe Station
Metrology
1419
Rudolph Auto EL Ellipsometer
Metrology
1419
Zeiss Axio Imager Optical Microscope
Metrology
1409
Filmetrics F20 (2)
Metrology
1409
Toho Technology FLX-2320 Thin Film Stress Measurement System
Metrology
1419
Veeco NT1100 Optical Profiling System
Metrology
1419
Dektak 150
Metrology
1419
Axio Fluorescence Microscope
Metrology
1420
Agilent B1500A Semiconductor Device Analyzer
Metrology
1416
Keyence VHX1000
Metrology
1414
Jandel Four Point Probe with RM3000 Test Unit
Metrology
1419
J.A. Woollam M-2000D Spectroscopic Ellipsometer
Metrology
1419
Filmetrics Profilm3D Optical Profiler
Metrology
1420
DektakXT Stylus Profilometer
Metrology
1419
