Multimode microscope with Nanoscope IV controller. The MultiMode performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, and magnetic fields:
- Tapping Mode
- Contact Mode AFM
- Phase Imaging
- Magnetic Force Microscopy (MFM)
- AFM Nanoindentation
- AFM in Liquid
- 10 Ám x 10 Ám non-magnetic scanner with 5 Ám vertical range.
- 125 Ám x 125 Ám non-magnetic scanner with 5 Ám vertical range.