Multimode microscope with Nanoscope IV controller. The MultiMode performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, and magnetic fields:

- Tapping Mode

- Contact Mode AFM

- Phase Imaging

- Magnetic Force Microscopy (MFM)

- AFM Nanoindentation

- AFM in Liquid

• 10 um x 10 um non-magnetic scanner with 5 um vertical range.
• 125 um x 125 um non-magnetic scanner with 5 um vertical range.