Multimode microscope with Nanoscope IV controller. The MultiMode performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, electrical and magnetic fields:
- Tapping Mode
- Contact Mode AFM
- Phase Imaging
- Magnetic Force Microscopy (MFM)
- Scanning Tunneling Microscopy (STM)
- Electric Force Microscopy (EFM)
- Surface Potential Microscopy
- 10 Ám x 10 Ám non-magnetic scanner with 2.5Ám vertical range.
- 125 Ám x 125 Ám non-magnetic scanner with 5Ám vertical range.